Title :
Exploiting Redundancy in Iterative H.264 Joint Source and Channel Decoding For Robust Video Transmission
Author :
Nasruminallah ; Hanzo, L.
Author_Institution :
Sch. of ECS, Univ. of Southampton, Southampton, UK
Abstract :
In this paper we propose joint optimisation of soft-bit assisted iterative joint source and channel decoding with the aid of our proposed EXIT chart optimised redundant source mapping (RSM) designed for guaranteed convergence to achieve an infinitesimally low bit error ratio (BER). Data-Partitioned (DP) H.264 source coded video is used to evaluate the performance of our system employing an iterative combination of RSM assisted soft-bit source decoding (SBSD) and recursive systematic convolution codes (RSC) for transmission over correlated narrowband Rayleigh fading channels. EXIT Charts were utilised to analyse the effect of redundancy using different RSM schemes on the attainable system performance, while keeping the overall bit-rate budget constant. Explicitly, our experimental results show that the proposed error protection scheme using RSM26 with dH,min = 4 outperform the RSM23 scheme having dH,min = 2 by about 5 dB, which in turn outperforms the RSM56 scheme having an identical dH,min and overall system code-rate by about 2 dB at the PSNR degradation point of 2 dB. Additionally, an Eb/N0 gain of 20 dB is attained using iterative soft-bit source and channel decoding with the aid of RSM23 relative to the identical-rate benchmarker.
Keywords :
combined source-channel coding; convolutional codes; data compression; error statistics; iterative decoding; video coding; BER; EXIT chart; RSC; RSM; Rayleigh fading channels; SBSD; bit error ratio; channel decoding; iterative H.264 joint source; recursive systematic convolution codes; redundant source mapping; soft-bit source decoding; video coding; video transmission; Bit error rate; Convergence; Convolution; Design optimization; Fading; Iterative decoding; Narrowband; Performance analysis; Redundancy; Robustness;
Conference_Titel :
Vehicular Technology Conference (VTC 2010-Spring), 2010 IEEE 71st
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-2518-1
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2010.5493802