DocumentCode
2770457
Title
A novel design flow for a 3D heterogeneous system prototyping platform
Author
Huang, Chun-Ming ; Yang, Chih-Chyau ; Wu, Chien-Ming ; Chiu, Chun-Chieh ; Liu, Yi-Jun ; Chu, Chun-Chieh ; Chang Nien-Hsiang ; Chen, Wen-Ching ; Lin, Chih-Hsing ; Luo, Hua-Hsin
Author_Institution
Nat. Chip Implementation Center (CIC), Hsinchu, Taiwan
fYear
2012
fDate
12-14 Sept. 2012
Firstpage
78
Lastpage
82
Abstract
This paper presents a novel design flow for three-dimensional (3D) heterogeneous system prototyping platform, namely, MorPACK (morphing package). The 3D-stacking technique makes the MorPACK platform with heterogeneous integration capabilities through connection modules and circuit modules. Based on system partition and tri-state interface connecting, the MorPACK system can be efficiently extended by system bus interfaces and can improve the functions by only updating the bare die/module. In addition, the total silicon prototyping cost of heterogeneous SoC projects can be greatly reduced by sharing the MorPACK common system platform. To demonstrate the effectiveness of the proposed platform, six SoC projects are implemented. The results show that there are 79.13% fabrication cost reduced by the MorPACK platform in TSMC 90nm CMOS. Besides, around 60% performance improvement of operation frequency can be benefited.
Keywords
CMOS integrated circuits; integrated circuit design; integrated circuit packaging; system buses; system-on-chip; 3D heterogeneous system prototyping platform; 3D-stacking technique; MorPACK system; TSMC CMOS; circuit module; connection module; design flow; fabrication cost; heterogeneous SoC project; heterogeneous integration capabilities; morphing package; silicon prototyping cost; size 90 nm; system bus interface; system partition; tristate interface; Computer architecture; Fabrication; Hardware; IP networks; Software; Substrates; System-on-a-chip; 3D Heterogeneous Integrated Platform; Mor-PACK; Platform-based Design;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2012 IEEE International
Conference_Location
Niagara Falls, NY
ISSN
2164-1676
Print_ISBN
978-1-4673-1294-3
Type
conf
DOI
10.1109/SOCC.2012.6398375
Filename
6398375
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