Title :
Fault diagnosis in analogue electronics without fault models or prior experience
Author :
Wakeling, A.J. ; McKeon, A.
Author_Institution :
ATE Div., Schlumberger Technol., Wimborne, UK
Abstract :
The paper describes a method for detecting and locating faults in analogue systems which uses minimal probing and no fault models. It only uses models of the correct behaviour of components. Consequently, provided that a stimulus can be applied to the circuit which will result in measurements which are different from those expected from good circuit, the method is able to diagnose any kind of fault within the accuracy of the models and measurements
Keywords :
analogue circuits; artificial intelligence; circuit analysis computing; failure analysis; fault location; integrated circuit testing; analogue electronics; analogue systems; artificial intelligence; fault detection; fault diagnosis; fault location;
Conference_Titel :
Intelligent Fault Diagnosis - Part 2: Model-Based Techniques, IEE Colloquium on
Conference_Location :
London
