• DocumentCode
    277054
  • Title

    Fault diagnosis in analogue electronics without fault models or prior experience

  • Author

    Wakeling, A.J. ; McKeon, A.

  • Author_Institution
    ATE Div., Schlumberger Technol., Wimborne, UK
  • fYear
    1992
  • fDate
    33660
  • Firstpage
    42522
  • Lastpage
    42525
  • Abstract
    The paper describes a method for detecting and locating faults in analogue systems which uses minimal probing and no fault models. It only uses models of the correct behaviour of components. Consequently, provided that a stimulus can be applied to the circuit which will result in measurements which are different from those expected from good circuit, the method is able to diagnose any kind of fault within the accuracy of the models and measurements
  • Keywords
    analogue circuits; artificial intelligence; circuit analysis computing; failure analysis; fault location; integrated circuit testing; analogue electronics; analogue systems; artificial intelligence; fault detection; fault diagnosis; fault location;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Intelligent Fault Diagnosis - Part 2: Model-Based Techniques, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    167918