DocumentCode :
2770610
Title :
An O(n1.5 log n) 1-d compaction algorithm
Author :
Lo, Chi-Yuan ; Varadarajan, Ravi
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1990
fDate :
24-28 Jun 1990
Firstpage :
382
Lastpage :
387
Abstract :
Key algorithms and properties of 1-d IC layout compaction are presented. In particular, the spacing constraint formulation problem is mapped into the vertical visibility graph construction problem, whose time complexity is O(n log n) if element swappings are not considered. This approach generates enough constraints for the later automatic jogging purposes, while maintaining graph sparsity. The graph solution algorithm is made event-driven to achieve O(n1.5 log n) expected running time. For hierarchical module assembly. a simple port abstraction method is used with O(n1.5 log n) worst-case time complexity that allows cells to stretch and pitch match. The speed involvement is due to a transformation to ensure all weights are nonpositive, where the fast Dijkstra´s longest path algorithm call be used. A reverse transformation is required to obtain the solution. An integrated leaf cell compaction and module assembly algorithm was proved to be free from the xy interlock problem. The module assembly problem was established as an integer linear programming problem where there is no known fast algorithm. A heuristic method is used instead to explore layout hierarchy as a practical solution with high speed, low memory and minor area penalties
Keywords :
VLSI; circuit layout CAD; computational complexity; integer programming; linear programming; 1-d IC layout compaction; VLSI; automatic jogging; fast Dijkstra´s longest path algorithm; graph solution algorithm; graph sparsity; heuristic method; hierarchical module assembly; integer linear programming; port abstraction method; spacing constraint formulation; time complexity; vertical visibility graph construction; worst-case time complexity; Algorithm design and analysis; Assembly systems; Circuits; Compaction; Geometry; Integer linear programming; Solid modeling; Space technology; Virtual manufacturing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location :
Orlando, FL
ISSN :
0738-100X
Print_ISBN :
0-89791-363-9
Type :
conf
DOI :
10.1109/DAC.1990.114887
Filename :
114887
Link To Document :
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