Title :
Automatic gauging using a light-section microscope
Author :
Shabestari, Behrouz N. ; Miller, John W V ; Vaughan, Bobbi J. ; Pawlecki, Henry F.
Author_Institution :
Edison Ind. Syst. Center, Toledo, OH, USA
Abstract :
This paper describes the development of a cost effective and reliable spacer inspection system for AC-plasma display panels. The system generates three dimensional profiles of spacers using a light-section microscope in conjunction with a PC-based vision system. Structured lighting is used in the light section microscope to provide a measure of spacer height. The system provides an economical way for 100% inspection of all spacers to improve display panel quality and yield
Keywords :
automatic optical inspection; computer vision; gas-discharge displays; optical microscopy; size measurement; AC-plasma display panels; PC-based vision system; automatic gauging; display panel quality; inspection; light-section microscope; spacer height; spacer inspection system; structured lighting; three dimensional profiles; Aerospace industry; Costs; Displays; Electrodes; Geometry; Glass; Hardware; Inspection; Machine vision; Microscopy; Pollution measurement;
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
DOI :
10.1109/MWSCAS.1994.519102
