• DocumentCode
    2770900
  • Title

    Automatic gauging using a light-section microscope

  • Author

    Shabestari, Behrouz N. ; Miller, John W V ; Vaughan, Bobbi J. ; Pawlecki, Henry F.

  • Author_Institution
    Edison Ind. Syst. Center, Toledo, OH, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    1548
  • Abstract
    This paper describes the development of a cost effective and reliable spacer inspection system for AC-plasma display panels. The system generates three dimensional profiles of spacers using a light-section microscope in conjunction with a PC-based vision system. Structured lighting is used in the light section microscope to provide a measure of spacer height. The system provides an economical way for 100% inspection of all spacers to improve display panel quality and yield
  • Keywords
    automatic optical inspection; computer vision; gas-discharge displays; optical microscopy; size measurement; AC-plasma display panels; PC-based vision system; automatic gauging; display panel quality; inspection; light-section microscope; spacer height; spacer inspection system; structured lighting; three dimensional profiles; Aerospace industry; Costs; Displays; Electrodes; Geometry; Glass; Hardware; Inspection; Machine vision; Microscopy; Pollution measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519102
  • Filename
    519102