• DocumentCode
    2770920
  • Title

    STT-MRAM memory cells with enhanced on/off ratio

  • Author

    Patel, Ravi ; Ipek, Engin ; Friedman, Eby

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
  • fYear
    2012
  • fDate
    12-14 Sept. 2012
  • Firstpage
    148
  • Lastpage
    152
  • Abstract
    Resistive memory technologies are a path to high density, low static power on-chip memories. One such technology, STT-MRAM, exhibits high endurance and is capable of operating as a cache with high write activity. The typically small on/off resistance ratio of the device, however, complicates the sensing process. Two STT-MRAM memory cells are proposed to alleviate this issue. Of the three cells, the diode connected cell increases the resistance ratio by greater than 5x while consuming energy comparable to a standard memory cell during reads.
  • Keywords
    MRAM devices; cache storage; STT-MRAM memory cells; cache storage; diode connected cell; enhanced on/off ratio; resistive memory technologies; spin torque transfer magnetoresistive RAM; Logic gates; Magnetic tunneling; Random access memory; Resistance; Threshold voltage; Transistors; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2012 IEEE International
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    2164-1676
  • Print_ISBN
    978-1-4673-1294-3
  • Type

    conf

  • DOI
    10.1109/SOCC.2012.6398400
  • Filename
    6398400