DocumentCode :
2770970
Title :
Applying simulation model to uniform field space charge distribution measurements by the PEA method
Author :
Liu, Y. ; Salama, M.M.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume :
2
fYear :
1996
fDate :
16-19 Jun 1996
Firstpage :
466
Abstract :
Signals measured under uniform fields by the PEA method have been processed by the deconvolution procedure to obtain space charge distributions since 1988. To simplify data processing, a direct method has been proposed recently in which the deconvolution is eliminated. However, the surface charge cannot be represented well by the method because the surface charge has a bandwidth from zero to infinity. The bandwidth of the charge distribution must be much narrower than the bandwidths of the PEA system transfer function in order to apply the direct method properly. When surface charges cannot be distinguished from space charge distributions, the accuracy and the resolution of the obtained space charge distributions decrease. To overcome this difficulty, a simulation model is therefore proposed. This paper shows the authors attempts to apply the simulation model to obtain space charge distributions under plane-plane electrode configurations. Due to the page limitation for the paper, the charge distribution originated by the simulation model is compared to that obtained by the direct method with a set of simulated signals
Keywords :
electric breakdown; electrostatics; insulating materials; space charge; transfer functions; PEA method; charge distribution bandwidth; direct method; plane-plane electrode configurations; pulsed electro-acoustic method; simulation model; solid dielectrics; transfer function; uniform field space charge distribution; Bandwidth; Charge measurement; Current measurement; Data processing; Deconvolution; Electrodes; H infinity control; Signal processing; Space charge; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1089-084X
Print_ISBN :
0-7803-3531-7
Type :
conf
DOI :
10.1109/ELINSL.1996.549383
Filename :
549383
Link To Document :
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