DocumentCode :
2771110
Title :
Characterization of microfabricated shear stress sensors
Author :
Pan, Tao ; Hyman, Daniel ; Mehregany, Mehran ; Reshotko, Eli ; Willis, Briain
Author_Institution :
Dept. of Electr. Eng. & Appl. Phys., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
1995
fDate :
18-21 Jul 1995
Firstpage :
42522
Lastpage :
42528
Abstract :
This paper reports a dual effort to fabricate and calibrate micromachined shear stress sensors for wind tunnel instrumentation. Our team at CWRU has designed and fabricated both active and passive shear stress sensors based on microfabricated polysilicon lateral resonant structures. In addition to this effort, we have collaborated with Analog Devices to develop shear stress sensors with integrated electronics based on existing accelerometer devices and process technology. Sensors from both efforts have been tested in a macroscopic flow channel for characterization in compressible flow. The sensors from CWRU were optically calibrated at 9 Pa/μm of floating element deflection. The integrated sensors demonstrated a nominal sensitivity of 6 Pa/V. Packaging issues were found to be critical for proper sensor design and calibration. Misalignment of a few degrees from parallel to the fluid flow results in an order of magnitude difference in integrated sensor output
Keywords :
accelerometers; calibration; compressible flow; elemental semiconductors; flow measurement; microsensors; silicon; wind tunnels; Si; accelerometer devices; calibration; compressible flow; floating element deflection; integrated electronics; macroscopic flow channel; microfabricated shear stress sensors; nominal sensitivity; packaging issues; polysilicon lateral resonant structures; wind tunnel instrumentation; Accelerometers; Calibration; Collaboration; Instruments; Optical sensors; Packaging; Resonance; Sensor phenomena and characterization; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation in Aerospace Simulation Facilities, 1995. ICIASF '95 Record., International Congress on
Conference_Location :
Wright-Patterson AFB, OH
Print_ISBN :
0-7803-2088-3
Type :
conf
DOI :
10.1109/ICIASF.1995.519112
Filename :
519112
Link To Document :
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