Title :
A family of CMOS analog and mixed signal circuits in SiC for high temperature electronics
Author :
Rahman, Ashfaqur ; Shepherd, Paul D. ; Bhuyan, Shaila A. ; Ahmed, Shamim ; Akula, Sai K. ; Caley, Landon ; Alan Mantooth, H. ; Jia Di ; Matthew Francis, A. ; Holmes, James A.
Author_Institution :
Univ. of Arkansas, Fayetteville, AR, USA
Abstract :
This paper describes the simulation and test results of a family of analog and mixed signal circuits in silicon carbide CMOS technology at temperatures of 300°C and above. As SiC and wide bandgap devices in general grow in popularity for efficient and stable operation in high temperature and harsh environment applications, CMOS SiC integrated circuits can open up a new frontier of opportunity for miniaturization and system dependability. The building block circuits presented here can serve as the basis of rugged SiC system-on-chips for extreme environment applications.
Keywords :
CMOS analogue integrated circuits; high-temperature electronics; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; silicon compounds; system-on-chip; wide band gap semiconductors; CMOS analog circuits; CMOS integrated circuits; CMOS mixed signal circuits; CMOS technology; SiC; building block circuits; high temperature electronics; silicon carbide; system-on-chips; wide bandgap devices; CMOS integrated circuits; Field effect transistors; Integrated circuit modeling; Semiconductor device modeling; Silicon carbide; Temperature measurement;
Conference_Titel :
Aerospace Conference, 2015 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4799-5379-0
DOI :
10.1109/AERO.2015.7119302
