Comparison of the Kirchoff model and the IEM model for rough surface scattering using numerical simulation

Author

Haixiao, Weng ; Zongqian, Li ; Ning, LIU

Author_Institution

Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

fYear

2000

fDate

15-18 Aug. 2000

Firstpage

386

Lastpage

389

Abstract

The validity of the Kirchhoff approximation and IEM model for rough perfect conducting surface scattering is examined by comparison with simulation results obtained by solving integral equations. First, the surface current and scattered field of approximation for surfaces with different surface length, different root-mean-square surface height and wavelength is compared with solving integral equations. Then, the scattering coefficients calculated from the approximation and Monte Carlo simulation are compared.

Keywords

approximation theory; conducting bodies; electromagnetic wave scattering; integral equations; rough surfaces; IEM model; Kirchoff model; electromagnetic scattering; integral equations; numerical simulation; perfect conducting surface; root-mean-square surface height; rough surface; scattered field; scattering coefficients; surface current; surface length; Integral equations; Kirchhoff´s Law; Liquid crystal on silicon; Matrix decomposition; Numerical simulation; Rough surfaces; Scattering; Surface roughness; Surface waves; Taylor series;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas, Propagation and EM Theory, 2000. Proceedings. ISAPE 2000. 5th International Symposium on

Conference_Location

Beijing, China

Print_ISBN

0-7803-6377-9

Type

conf

DOI

10.1109/ISAPE.2000.894805

Filename

894805