Title :
Comparison of the Kirchoff model and the IEM model for rough surface scattering using numerical simulation
Author :
Haixiao, Weng ; Zongqian, Li ; Ning, LIU
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
The validity of the Kirchhoff approximation and IEM model for rough perfect conducting surface scattering is examined by comparison with simulation results obtained by solving integral equations. First, the surface current and scattered field of approximation for surfaces with different surface length, different root-mean-square surface height and wavelength is compared with solving integral equations. Then, the scattering coefficients calculated from the approximation and Monte Carlo simulation are compared.
Keywords :
approximation theory; conducting bodies; electromagnetic wave scattering; integral equations; rough surfaces; IEM model; Kirchoff model; electromagnetic scattering; integral equations; numerical simulation; perfect conducting surface; root-mean-square surface height; rough surface; scattered field; scattering coefficients; surface current; surface length; Integral equations; Kirchhoff´s Law; Liquid crystal on silicon; Matrix decomposition; Numerical simulation; Rough surfaces; Scattering; Surface roughness; Surface waves; Taylor series;
Conference_Titel :
Antennas, Propagation and EM Theory, 2000. Proceedings. ISAPE 2000. 5th International Symposium on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6377-9
DOI :
10.1109/ISAPE.2000.894805
