Title :
Use of near field probing to diagnose the (poor) performance of pyramidal-type absorbing materials
Author :
Liepa, Valdis V.
Author_Institution :
University of Michigan, Ann Arbor, MI, USA
Keywords :
Backscatter; Data analysis; Design optimization; Frequency measurement; Measurement standards; Near-field radiation pattern; Position measurement; Reflection; Testing; Thickness measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1982
Conference_Location :
Albuquerque, NM, USA
DOI :
10.1109/APS.1982.1148906
