Title :
Self-engaging and disengaging CMOS-MEMS probes
Author :
Draghi, Louis J. ; Bain, James A. ; Fedder, Gary K.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
CMOS-MEMS probes have the ability to interact with external surfaces mechanically and electrically through their conductive tips. Using only the electrothermal actuator of the probe, micro-Newton forces can be applied to make active probe contact with a conductive substrate. Measured cyclic contact resistance has a mean value of 7.4 kΩ and a standard deviation of 11.3 kΩ over 2450 cycles. When the probe actuator is repeatedly turned off, mechanical and electrical contacts are successfully disconnected. Piezoresistive sensors embedded within the probe cantilevers possess a resolution of 44 nm to detect when the tip has come into physical contact with an experimental surface and provide force feedback.
Keywords :
CMOS integrated circuits; cantilevers; electrical contacts; mechanical contact; micromechanical devices; piezoresistive devices; probes; CMOS-MEMS probes; conductive substrate; conductive tips; cyclic contact resistance; electrical contact; electrothermal actuator; force feedback; mechanical contact; microNewton forces; piezoresistive sensors; probe cantilevers; size 44 nm; Actuators; Bridge circuits; Contacts; Piezoresistance; Platinum; Probes; Substrates;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-9632-7
DOI :
10.1109/MEMSYS.2011.5734665