• DocumentCode
    2771325
  • Title

    Characterization of electromechanical properties of relaxor-PT piezoelectric single crystals

  • Author

    Geng, Xuecang ; Ritter, T.A. ; Park, S.-E.

  • Author_Institution
    Blatek Inc., State Coll. PA, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    571
  • Abstract
    In this paper, a new method has been developed to characterize the electromechanical properties of relaxor-PT piezoelectric crystals. In this method, 5 Z-cut samples were used to measure all the eleven electromechanical coefficients of the relaxor-PT piezoelectric crystals by the resonant method. In addition, a technique incorporating laser interferometry was used to precisely measure the piezoelectric constants d33 and d31
  • Keywords
    lead compounds; light interferometry; piezoelectric materials; PZN-PT crystal; PbZnO3NbO3-PbTiO3; characterization; electromechanical coefficients; electromechanical properties; laser interferometry; piezoelectric constants; relaxor-PT piezoelectric single crystals; resonant method; Crystalline materials; Crystals; Dielectric measurements; Displacement measurement; Educational institutions; Frequency measurement; Interferometry; Laser beams; Resonance; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.762215
  • Filename
    762215
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2771325