DocumentCode :
2771325
Title :
Characterization of electromechanical properties of relaxor-PT piezoelectric single crystals
Author :
Geng, Xuecang ; Ritter, T.A. ; Park, S.-E.
Author_Institution :
Blatek Inc., State Coll. PA, USA
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
571
Abstract :
In this paper, a new method has been developed to characterize the electromechanical properties of relaxor-PT piezoelectric crystals. In this method, 5 Z-cut samples were used to measure all the eleven electromechanical coefficients of the relaxor-PT piezoelectric crystals by the resonant method. In addition, a technique incorporating laser interferometry was used to precisely measure the piezoelectric constants d33 and d31
Keywords :
lead compounds; light interferometry; piezoelectric materials; PZN-PT crystal; PbZnO3NbO3-PbTiO3; characterization; electromechanical coefficients; electromechanical properties; laser interferometry; piezoelectric constants; relaxor-PT piezoelectric single crystals; resonant method; Crystalline materials; Crystals; Dielectric measurements; Displacement measurement; Educational institutions; Frequency measurement; Interferometry; Laser beams; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
ISSN :
1051-0117
Print_ISBN :
0-7803-4095-7
Type :
conf
DOI :
10.1109/ULTSYM.1998.762215
Filename :
762215
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2771325
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