DocumentCode
2771343
Title
Semi-naive Exploitation of One-Dependence Estimators
Author
Li, Nan ; Yu, Yang ; Zhou, Zhi-Hua
Author_Institution
Nat. Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
fYear
2009
fDate
6-9 Dec. 2009
Firstpage
278
Lastpage
287
Abstract
It is well known that the key of Bayesian classifier learning is to balance the two important issues, that is, the exploration of attribute dependencies in high orders for ensuring a sufficient flexibility in approximating the ground-truth dependencies, and the exploration of low orders for ensuring a stable probability estimate from limited training samples. By allowing one-order attribute dependencies, one-dependence estimators (ODEs) have been shown to be able to approximate the ground-truth attribute dependencies whilst keeping the effectiveness of probability estimation, and therefore leading to excellent performance. In previous studies, however, ODEs were exploited in simple ways, such as by averaging, for classification. In this paper, we propose a semi-naive exploitation of ODEs that fits a function of ODEs to pursue higher-order attribute dependencies. Extensive experiments show that the proposed SNODE approach can achieve better performance than many state-of-the-art Bayesian classifiers.
Keywords
Bayes methods; belief networks; estimation theory; pattern classification; Bayesian classifier learning; one-dependence estimators; probability estimation; semi-naive exploitation; Bayesian methods; Constraint optimization; Data mining; Laboratories; Maximum likelihood estimation; Performance gain; Proposals; Bayesian classifier; one-dependence estimator; semi-naive Bayes;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2009. ICDM '09. Ninth IEEE International Conference on
Conference_Location
Miami, FL
ISSN
1550-4786
Print_ISBN
978-1-4244-5242-2
Electronic_ISBN
1550-4786
Type
conf
DOI
10.1109/ICDM.2009.64
Filename
5360253
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