Title :
Mysterious behavior of the excited near fields on printed-circuit transmission lines: physical contribution of a non-physical solution
Author :
Tsuji, Mikio ; Shigesawa, Hiroshi
Author_Institution :
Dept. of Electron., Doshisha Univ., Kyoto, Japan
Abstract :
It is well known that, when most printed-circuit transmission lines are excited by a practical monochromatic high-frequency source, the near-field amplitude decay exponentially along the line axis due to the excitation of a leaky mode. Such a situation usually occurs when the leaky mode is the only physical solution at a given frequency. However, we sometimes meet with an unexpected situation in which the near-field amplitude decays with a decay constant much smaller than that expected from the leaky-mode eigenvalue, even though the only physical solution at the operating frequency is the leaky-mode solution. No answer to this mysterious situation could be found previously, until when we found that such a slow decay in the near-field-amplitude variation depends strongly on an indirect effect from a nonphysical improper-real solution that exists at the operating frequency. We show several kinds of evidence that prove our interpretation of this mysterious problem, including theoretical discussions and experimental results.
Keywords :
eigenvalues and eigenfunctions; electromagnetic fields; finite difference time-domain analysis; printed circuits; slot lines; waveguide theory; FDTD; MIC circuits; MMIC circuits; decay constant; excited near fields; leaky mode excitation; leaky-mode eigenvalue; leaky-mode solution; monochromatic high-frequency source; mysterious behavior; near-field amplitude exponential decay; nonphysical solution; operating frequency; printed-circuit transmission lines; slot line axis; Eigenvalues and eigenfunctions; Finite difference methods; Frequency; Strips; Transmission line theory; Transmission lines;
Conference_Titel :
Antennas, Propagation and EM Theory, 2000. Proceedings. ISAPE 2000. 5th International Symposium on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6377-9
DOI :
10.1109/ISAPE.2000.894809