DocumentCode :
2771418
Title :
Micro-structural characteristics and electron field emission properties of transition metal-fullerene compound TiC60 films
Author :
Chen, J. ; Xue, K. ; An, J. ; Ke, N. ; Xu, J.B.
Author_Institution :
Dept. of Electron. Eng. & Mater. Sci., Chinese Univ. of Hong Kong, Shatin, China
fYear :
2003
fDate :
16-18 Dec. 2003
Firstpage :
21
Lastpage :
24
Abstract :
In this paper, FEE characteristics of a transition metal-fullerene compound TiC60 film have been investigated, and the enhancing emission mechanism has been discussed in terms of the structural change in the TiC60 thin films.
Keywords :
Raman spectra; atomic force microscopy; crystal microstructure; electron field emission; fullerene compounds; surface morphology; thin films; titanium compounds; AFM; Raman spectra; TiC60; TiC60 films; atomic force microscopy; electron field emission; microstructural characteristics; surface morphology; transition metal-fullerene compound; Carbon dioxide; Conducting materials; Copper; Electron emission; Organic materials; Rough surfaces; Substrates; Surface roughness; Surface topography; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
Print_ISBN :
0-7803-7749-4
Type :
conf
DOI :
10.1109/EDSSC.2003.1283475
Filename :
1283475
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2771418
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