DocumentCode :
2771569
Title :
Ferroelectric memory design based on grounded-plate PMOS-gate cell architecture
Author :
Chung, Yeonbae ; Kim, Jung-Hyun ; Yoon, Jae-Eun
Author_Institution :
Sch. of Electron. & Electr. Eng., Kyungpook Nat. Univ., Daegu, South Korea
fYear :
2003
fDate :
16-18 Dec. 2003
Firstpage :
55
Lastpage :
58
Abstract :
This paper proposes a new FRAM design style based on grounded-plate PMOS-gate (GPPG) cell architecture. A GPPG cell consists of a PMOS access transistor and a ferroelectric capacitor. Its plate is grounded. The proposed scheme employs three novel operating methods: 1) VDD precharged bitline, 2) negative-voltage wordline technique and 3) negative-pulse restore. Because this configuration doesn´t need the on-pitch plate control circuitry, it is effective in realizing cost-effective chip sizes. Implementation for an experimental 2.5-V, 2-Mb FRAM prototype design in a 0.5-μm technology shows a cell array efficiency of 57%, access time of 85 ns and an active current of 12 mA, respectively.
Keywords :
CMOS memory circuits; MOSFET; ferroelectric capacitors; ferroelectric storage; logic arrays; random-access storage; 0.5 micron; 12 mA; 2 Mbit; 2.5 V; 85 ns; FRAM prototype design; PMOS access transistor; VDD precharged bitline; cell array efficiency; cost-effective chip sizes; ferroelectric capacitor; ferroelectric memory design; grounded-plate PMOS-gate cell architecture; negative-pulse restore; negative-voltage wordline method; Capacitors; Circuits; Ferroelectric films; Ferroelectric materials; Nonvolatile memory; Pulse amplifiers; Random access memory; Storage area networks; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
Print_ISBN :
0-7803-7749-4
Type :
conf
DOI :
10.1109/EDSSC.2003.1283482
Filename :
1283482
Link To Document :
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