Title :
BER of UCA in Rician fading channel
Author :
Huang, Zhiyong ; Balanis, Constantine A.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ
Abstract :
The modeling of wireless channels vary greatly in different propagation environments. For example, the line-of-sight (LoS) radio links and non-line-of-sight (NLoS) are two basic channel models in wireless communications, but they are totally different from each other. For a LoS channel, if the signals propagate in an additive white Gaussian noise (AWGN) environment, it is referred to as an AWGN channel. However, the AWGN channel is seldom available for wireless systems in urban areas. For a mobile wireless system inside a city, since there are many structures between the base station and the mobile station, the signals are transmitted in NLoS channels with strong influence from diffractions and scatterers (Stuber, 2001). Thus, the received signal may arrive from many different directions and different delays. This phenomenon is referred to as multipath propagation. The multipath signals may be constructive or destructive and thus many fading models are proposed to represent it, such as Rayleigh fading and Rician fading. Rician fading is observed when, in addition to multipath signals, a direct path between the transmitter and the receiver exists.
Keywords :
AWGN channels; Rician channels; error statistics; multipath channels; radio receivers; radio transmitters; wireless channels; AWGN channel; BER; Rician fading channel; UCA; additive white Gaussian noise channel; base station; mobile station; mobile wireless system; multipath propagation; multipath signals; nonline-of-sight radio links; radio receiver; radio transmitter; uniform circular array; wireless channels; wireless communications; AWGN channels; Additive white noise; Base stations; Bit error rate; Cities and towns; Radio link; Rayleigh channels; Rician channels; Urban areas; Wireless communication;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619570