DocumentCode :
2771757
Title :
Significance of Episodes Based on Minimal Windows
Author :
Tatti, Nikolaj
Author_Institution :
Adv. Database Res. & Modelling (ADReM), Univ. of Antwerp, Antwerp, Belgium
fYear :
2009
fDate :
6-9 Dec. 2009
Firstpage :
513
Lastpage :
522
Abstract :
Discovering episodes, frequent sets of events from a sequence has been an active field in pattern mining. Traditionally, a level-wise approach is used to discover all frequent episodes. While this technique is computationally feasible it may result in a vast number of patterns, especially when low thresholds are used. In this paper we propose a new quality measure for episodes. We say that an episode is significant if the average length of its minimal windows deviates greatly when compared to the expected length according to the independence model. We can apply this measure as a post-pruning step to test whether the discovered frequent episodes are truly interesting and consequently to reduce the number of output. As a main contribution we introduce a technique that allows us to compute the distribution of lengths of minimal windows using the independence model. Such a computation task is surpisingly complex and in order to solve it we compute the distribution iteratively starting from simple episodes and progressively moving towards the more complex ones. In our experiments we discover candidate episodes that have a sufficient amount of minimal windows and test each candidate for significance. The experimental results demonstrate that our approach finds significant episodes while ignoring uninteresting ones.
Keywords :
data mining; probability; statistical testing; episode discovery; episode mining; independence model; level-wise approach; pattern mining; statistical testing; Data mining; Databases; Distributed computing; Length measurement; Random sequences; Testing; episode mining; independence model; minimal window; statistical test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, 2009. ICDM '09. Ninth IEEE International Conference on
Conference_Location :
Miami, FL
ISSN :
1550-4786
Print_ISBN :
978-1-4244-5242-2
Electronic_ISBN :
1550-4786
Type :
conf
DOI :
10.1109/ICDM.2009.23
Filename :
5360277
Link To Document :
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