Title :
Anomalous absorption effects for beams incident on lossy layered structures
Author :
Shah, V. ; Tamir, T.
Author_Institution :
Polytechnic Institute of New York, Brooklyn, NY, USA
Keywords :
Absorption; Couplers; Electronic equipment testing; Frequency domain analysis; Integrated optics; Nondestructive testing; Optical filters; Poles and zeros; Reflectivity; System testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1982
Conference_Location :
Albuquerque, NM, USA
DOI :
10.1109/APS.1982.1148941
