Title :
Printed coupled lines with lumped loads for realizing degenerate band edge and magnetic photonic crystal modes
Author :
Mumcu, Gokhan ; Sertel, Kubilay ; Volakis, John L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH
Abstract :
This paper proposes 4/6-port lumped element printed microstrip circuits composed of dual and coupled transmission lines to realize higher order dispersion behaviors emulating the (degenerate band edge) DBE crystals and magnetic photonic crystals (MPC). Harnessing the maximally flat dispersion of DBE unit cells resulted in a miniature printed antenna with a lambda0/9 times lambda0/9 footprint, 3% bandwidth and 4.5 dB gain. As such, this DBE antenna is found to be near the optimal Chu-Harrington limits. It is demonstrated that the DBE unit cell can be further miniaturized via lumped capacitor inclusions. Also, for the first time, a straightforward printed circuit realization of the stationary inflection points (SIP) is presented. Its realization using simple printed circuits is expected to allow for new delay lines and non-linear devices harnessing these novel SIP properties. Higher order filters and high aperture efficient array designs are also mentioned as future applications of the DBE and MPC circuits.
Keywords :
capacitors; coupled transmission lines; dispersion (wave); lumped parameter networks; microstrip antennas; photonic crystals; printed circuits; Chu-Harrington limit; DBE unit cells; MPC crystals; SIP; coupled transmission lines; degenerate band edge crystal modes; dual transmission lines; higher order dispersion; lumped capacitor; lumped element printed microstrip circuit; lumped load; magnetic photonic crystal modes; miniature printed antenna; printed coupled lines; stationary inflection points; Bandwidth; Capacitors; Coupling circuits; Distributed parameter circuits; Gain; Magnetic circuits; Magnetic materials; Microstrip; Photonic crystals; Printed circuits;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619592