Title :
A Sub-Band Based Technique for Low Power Medium Data Rate Ultra Wide Band Communication
Author :
Bynam, Kiran ; Nair, Jinesh P. ; Sen, Debarati ; Sinha, Rahul ; Naniyat, Arun
Author_Institution :
Samsung India Software Oper., Bangalore, India
Abstract :
A sub-band based ultra wideband (SUWB) system is proposed. The technique provides scope for using the ultra wideband bandwidth efficiently by exploiting the available link margin for short range communications. The bandwidth of 500 MHz or more is divided into a fixed number of sub-bands. The data transmission scheme over multiple sub-bands can be designed to achieve higher data rate, higher reliability or support multi-user access. The SUWB system facilitates low power implementations by reducing the sampling rate requirements and also by the use of an orthogonal spreading code based interference rejection and multi-path cancellation receiver. The SUWB system avoids the need for individual down-conversion and filtering of the sub-bands. The requisite properties of the spreading codes are also provided. The simulation results in terms of the BER performance of the method for the IEEE 802.15.4a channel models are presented. The desirable performance is obtained for low and medium delay spread channels even without employing any equalization method.
Keywords :
error statistics; interference suppression; orthogonal codes; personal area networks; radiofrequency interference; ultra wideband communication; BER performance; IEEE 802.15.4a channel models; SUWB system; data transmission scheme; multipath cancellation receiver; orthogonal spreading code-based interference rejection; sampling rate requirements; short range communications; subband filtering; subband-based technique; ultrawideband communication; Bandwidth; Bit error rate; Data communication; Delay; Filtering; Interference cancellation; Power system reliability; Sampling methods; Ultra wideband communication; Ultra wideband technology;
Conference_Titel :
Vehicular Technology Conference (VTC 2010-Spring), 2010 IEEE 71st
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-2518-1
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2010.5493895