DocumentCode :
2772374
Title :
Origin of near-band-edge photoluminescence of GaAsN
Author :
Inagaki, M. ; Suzuki, H. ; Kojima, N. ; Ohshita, Y. ; Yamaguchi, M.
Author_Institution :
Toyota Technol. Inst., Nagoya, Japan
fYear :
2010
fDate :
20-25 June 2010
Abstract :
The emission processes at high energy edge of PL spectra of GaAsN are clarified by the temperature dependence photoluminescence (PL) spectra and time resolved PL spectra. The PL spectra and TR-PL spectra of GaAsN are deconvoluted by three Gaussian functions (P1, P2 and P3 from high energy side). There are three emission processes at high energy edge of PL spectra of GaAsN. The energies of P2 and P3 are ~6 meV and ~17 meV lower than that of P1. The integrated intensity of P1 increases with increasing temperature from 4.2K to 50K, while those of the other peaks decrease. From these results, following possibility are suggested: (i) the origin of P1 is band to band transition, (ii) the origin of P2 is caused by free exciton or shallow donor related recombination, and (iii) P3 originate from donor-acceptor pair emission or overlapping of emission which comes from a number of localized states.
Keywords :
III-V semiconductors; arsenic compounds; gallium compounds; nitrogen compounds; photoluminescence; GaAsN; Gaussian function; donor acceptor pair emission; emission process; near band edge photoluminescence; shallow donor related recombination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5616417
Filename :
5616417
Link To Document :
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