Title :
Noise-aware domino logic design for deep submicron technology
Author :
Yoon, Seok-Soo ; Yoon, Seok-Ryong ; Kim, Soo-Won ; Kim, Chulwoo
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Abstract :
In this paper, we describe split-path domino (SP domino) logic which exhibits high-speed operation due to halved charge sharing problem. SP domino logic splits NMOS stacked transistors use for logic evaluation, in order to reduce charge sharing problem, which has become one of the critical noise problem in VDSM technology. Furthermore, SP domino logic needs no signal ordering, which simplifies logic synthesis. Our experimental results on several logic gates using 0.18 μm CMOS technology showed that proposed logic improves performance over textbook domino circuit up to 17% under the same noisy environment. Hence, SP domino logic is a good candidate for high-speed low-voltage operation in a very noisy environment.
Keywords :
CMOS logic circuits; integrated circuit modelling; integrated circuit noise; integrated logic circuits; network synthesis; CMOS technology; NMOS stacked transistors; charge sharing problem; deep submicron technology; logic gate; split path domino logic circuit design; CMOS logic circuits; CMOS technology; Circuit noise; Circuit synthesis; Logic design; Logic gates; MOS devices; Noise reduction; Signal synthesis; Working environment noise;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
Print_ISBN :
0-7803-7749-4
DOI :
10.1109/EDSSC.2003.1283531