DocumentCode :
2772551
Title :
BVA resonators: analysis of its low G-sensitivity
Author :
Boy, J.J. ; Deyzac, F. ; Gufflet, N.
Author_Institution :
ENSMM/LCEP, Besancon, France
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
905
Abstract :
The accelerometric and magnetic sensitivities of a quartz resonator are commonly attributed to the design of the resonator, for the main part. Since a few years, it is well-known that G-sensitivity can reach zero if the geometry of the structure (including blank geometry, orientation of the mounting, number of supports, ...) leads to the perfect symmetry around the three axes. In this paper, we show that the BVA resonator has been designed to exhibit a very low G-sensitivity (largely lower than 1*10-10/G). By finite element analysis, we have quantified the influence of some symmetry defects due to manufacturing process (as orientation of the mounting, shift between the vibrating area center and the blank center, ...) on the accelerometric sensitivity with different boundary conditions. Furthermore, we have calculated the frequency shift due to a slight dissymmetry of the mounting structure and deduced how G-sensitivity increases when the inhomogeneity of the stress distribution in the vibrating area increases. At least, we compare these theoretical results to experimental values obtained by two methods: measurements under random vibrations in the range [20-100 Hz], measurement of the frequency shift due to a 2G-tipover test around a given axis
Keywords :
crystal resonators; finite element analysis; quartz; sensitivity; BVA resonator; G-sensitivity; SiO2; accelerometric sensitivity; finite element analysis; frequency shift; quartz resonator; random vibrations; stress distribution; symmetry defects; Acceleration; Area measurement; Finite element methods; Frequency measurement; Geometry; Magnetic analysis; Magnetic field measurement; Space technology; Stress measurement; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
ISSN :
1051-0117
Print_ISBN :
0-7803-4095-7
Type :
conf
DOI :
10.1109/ULTSYM.1998.762290
Filename :
762290
Link To Document :
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