Title :
Cross-layer Throughput Analysis with Capture Effect in Wireless Local Area Networks
Author :
Ge, Xiaohu ; Yang, Yang ; Chen, Hsiao-Hwa ; Zhu, Yaoting
Author_Institution :
Dept. Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan
Abstract :
In this paper the impact of capture effect on the IEEE 802.11 networks has been investigated. In order to have insight into capture effect in the MAC mechanism, a new Markov chain model with capture effect has been built for describing the backoff scheme in the IEEE 802.11 networks. Based on the new iterative algorithm used for calculating the transmission probability, a new throughput model considering the impact of capture effect on the back-off scheme has been proposed. The numerical simulation results show that the capture effect has more impact on the basic access mechanism than that on the RTS/CTS access mechanism.
Keywords :
Markov processes; access protocols; iterative methods; probability; wireless LAN; IEEE 802.11 networks; MAC mechanism; Markov chain model; access mechanism; backoff scheme; capture effect; cross-layer throughput analysis; iterative algorithm; numerical simulation; throughput model; transmission probability; wireless local area networks; Access protocols; Cities and towns; Communications Society; Educational institutions; Media Access Protocol; Performance analysis; Physical layer; Rayleigh channels; Throughput; Wireless LAN;
Conference_Titel :
Wireless Communications and Networking Conference, 2007.WCNC 2007. IEEE
Conference_Location :
Kowloon
Print_ISBN :
1-4244-0658-7
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2007.760
