DocumentCode :
2772665
Title :
Promoting Total Efficiency in Text Clustering via Iterative and Interactive Metric Learning
Author :
Momma, Michinari ; Morinaga, Satoshi ; Komura, Daisuke
Author_Institution :
Common Platform Software Res. Labs., NEC Corp., Kawasaki, Japan
fYear :
2009
fDate :
6-9 Dec. 2009
Firstpage :
878
Lastpage :
883
Abstract :
In this paper, we propose a framework to make the text clustering process, as a whole, efficient. In a real text clustering task, an analyst usually has some expectation on the results in mind. However, a single run of a clustering algorithm on the preprocessed data would not satisfy the expectation. Then the analyst faces labor-intensive trials for improving the results that involve repetitive feature refinement and parameter tuning. We develop the Iterative and Interactive Metric Learning System (IIMLS) for addressing the challenge. Specifically, IIMLS allows analysts to input feedback on a current clustering result. Given the feedback, IIMLS optimizes metric in the feature space so that the clustering algorithm applied with the refined metric would reflect the feedback. As a byproduct, learned metric may be used for a similar dataset. Illustrative examples on a real-world dataset show IIMLS can dramatically improve efficiency of a text clustering task. The learned ¿knowledge¿, or the metric, is visualized for gaining insights of the optimized feature metric.
Keywords :
algorithm theory; iterative methods; optimisation; pattern classification; text analysis; IIMLS optimizes metric; current clustering result; interactive metric learning; interactive metric learning system; labor intensive trials; optimized feature metric; parameter tuning; promoting total efficiency; real text clustering task; real world dataset show; repetitive feature refinement; single run clustering algorithm; text clustering process; via iterative; Clustering algorithms; Data mining; Engines; Feedback; Iterative algorithms; Laboratories; Learning systems; Man machine systems; National electric code; Visualization; data preprocessing; interactive system; metric learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, 2009. ICDM '09. Ninth IEEE International Conference on
Conference_Location :
Miami, FL
ISSN :
1550-4786
Print_ISBN :
978-1-4244-5242-2
Electronic_ISBN :
1550-4786
Type :
conf
DOI :
10.1109/ICDM.2009.124
Filename :
5360327
Link To Document :
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