• DocumentCode
    2772895
  • Title

    Multiple Linear Regression to detect shielding effectiveness degradations

  • Author

    Audone, Bruno ; Giunta, Gergio

  • Author_Institution
    EMC, Torino
  • fYear
    2008
  • fDate
    8-12 Sept. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Multiple linear regression can be successfully used to detect the shielding effectiveness (SE) degradation of enclosures by comparing the results of tests performed at regular time intervals. Simulations are performed on a rectangular metal enclosure with rectangular and circular apertures of various sizes. The frequency curves of the voltages picked by sensors located inside shielded enclosures are interpolated with multiple linear regression. The regression coefficients interpolating the results of the simulations using the same simulation setups are compared; their variations give the indication that the SE has degraded.
  • Keywords
    electromagnetic compatibility; electromagnetic shielding; regression analysis; circular apertures; multiple linear regression; rectangular apertures; rectangular metal enclosure; regression coefficients; shielded enclosures; shielding effectiveness degradation detection; Apertures; Degradation; Electromagnetic compatibility; Frequency; Gaussian noise; Linear regression; Performance evaluation; Testing; Vectors; Voltage; EMC; multiple regression; susceptibility;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
  • Conference_Location
    Hamburg
  • Print_ISBN
    978-1-4244-2737-6
  • Electronic_ISBN
    978-1-4244-2737-6
  • Type

    conf

  • DOI
    10.1109/EMCEUROPE.2008.4786802
  • Filename
    4786802