DocumentCode :
2772895
Title :
Multiple Linear Regression to detect shielding effectiveness degradations
Author :
Audone, Bruno ; Giunta, Gergio
Author_Institution :
EMC, Torino
fYear :
2008
fDate :
8-12 Sept. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Multiple linear regression can be successfully used to detect the shielding effectiveness (SE) degradation of enclosures by comparing the results of tests performed at regular time intervals. Simulations are performed on a rectangular metal enclosure with rectangular and circular apertures of various sizes. The frequency curves of the voltages picked by sensors located inside shielded enclosures are interpolated with multiple linear regression. The regression coefficients interpolating the results of the simulations using the same simulation setups are compared; their variations give the indication that the SE has degraded.
Keywords :
electromagnetic compatibility; electromagnetic shielding; regression analysis; circular apertures; multiple linear regression; rectangular apertures; rectangular metal enclosure; regression coefficients; shielded enclosures; shielding effectiveness degradation detection; Apertures; Degradation; Electromagnetic compatibility; Frequency; Gaussian noise; Linear regression; Performance evaluation; Testing; Vectors; Voltage; EMC; multiple regression; susceptibility;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
Type :
conf
DOI :
10.1109/EMCEUROPE.2008.4786802
Filename :
4786802
Link To Document :
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