Title :
Naive Bayes Classification of Uncertain Data
Author :
Ren, Jiangtao ; Lee, Sau Dan ; Chen, Xianlu ; Ben Kao ; Cheng, Reynold ; Cheung, David
Author_Institution :
Dept. of Comput. Sci., Sun Yat-sen Univ., Guangzhou, China
Abstract :
Traditional machine learning algorithms assume that data are exact or precise. However, this assumption may not hold in some situations because of data uncertainty arising from measurement errors, data staleness, and repeated measurements, etc. With uncertainty, the value of each data item is represented by a probability distribution function (pdf). In this paper, we propose a novel naive Bayes classification algorithm for uncertain data with a pdf. Our key solution is to extend the class conditional probability estimation in the Bayes model to handle pdf´s. Extensive experiments on UCI datasets show that the accuracy of naive Bayes model can be improved by taking into account the uncertainty information.
Keywords :
belief networks; learning (artificial intelligence); probability; machine learning algorithms; naive Bayes classification; probability distribution function; uncertain data classification; Classification algorithms; Computer science; Data mining; Kernel; Machine learning algorithms; Measurement errors; Probability distribution; Sun; Testing; Uncertainty; Uncertain data mining; naive Bayes model;
Conference_Titel :
Data Mining, 2009. ICDM '09. Ninth IEEE International Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-5242-2
Electronic_ISBN :
1550-4786
DOI :
10.1109/ICDM.2009.90