• DocumentCode
    2772911
  • Title

    Identification friend-or-foe (IFF) sensor uncertainties, ambiguities, deception and their application to the multi-source fusion process

  • Author

    Schuck, Tod M. ; Shoemaker, Bill ; Willey, Jeff

  • Author_Institution
    Lockheed Martin Naval Electron. & Surveillance Syst., Moorestown, NJ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    85
  • Lastpage
    94
  • Abstract
    The importance of quantifying and modeling sensor uncertainties associated with kinematic, attribute, and hybrid sensors and their effect on the data fusion process (Bayesian, Dempster-Shafer, etc.) has not been well described. This paper explores some of the characteristics and uncertainties associated with MK XII Identification Friend-or-Foe (IFF) including its limitations, inherent error sources, and robustness to jamming and interference. A general multi-source sensor fusion process is described using Non-Cooperative Target Recognition, electronic support measures and IFF dissimilar source inputs with specific attention placed on realizable IFF sensor systems and how they need to be characterized in order to understand and design an optimized and effective multi-source fusion process
  • Keywords
    belief networks; electronic countermeasures; inference mechanisms; jamming; object recognition; radar interference; radar tracking; search radar; sensor fusion; target tracking; uncertainty handling; Bayesian theory; Dempster-Shafer theory; IFF sensor uncertainties; MK XII IFF; active hypothesis support; ambiguities; attribute sensors; deception; dissimilar source inputs; electronic support measures; error sources; hybrid sensors; kinematic sensors; multi-source fusion process; non-cooperative target recognition; robustness to jamming; Bayesian methods; Interference; Jamming; Kinematics; Robustness; Sensor fusion; Sensor phenomena and characterization; Sensor systems; Target recognition; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    National Aerospace and Electronics Conference, 2000. NAECON 2000. Proceedings of the IEEE 2000
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-6262-4
  • Type

    conf

  • DOI
    10.1109/NAECON.2000.894896
  • Filename
    894896