Title :
Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
Author :
Stanisavljevic, Milos ; Schmid, Alexandre ; Leblebici, Yusuf
Author_Institution :
Swiss Fed. Inst. of Technol., Lausanne
Abstract :
An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations is used for the reliability analysis of the examined logic families. A benefit of the differential circuit over standard single-ended is shown in case of complex systems. Moreover, analysis of reliability of different circuits and discussion on the optimal granularity of redundant blocks was made.
Keywords :
Monte Carlo methods; electronic engineering computing; fault tolerance; feedforward neural nets; integrated logic circuits; neural chips; reliability; Monte-Carlo simulations; circuit architecture; differential deep-submicron circuits; differential signaling; fault-tolerance; massive defect density; optimal granularity; redundant blocks; reliability analysis; robust feed-forward architecture; CMOS logic circuits; Circuit faults; Computer architecture; Fault tolerance; Feedforward systems; Microelectronics; Reliability; Robustness; Software tools; Space technology;
Conference_Titel :
Neural Networks, 2006. IJCNN '06. International Joint Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-9490-9
DOI :
10.1109/IJCNN.2006.247183
