Title :
Maximum End-to-End Throughput of Chain-Topology Wireless Multi-Hop Networks
Author :
Yoo, Jae-Yong ; Kim, JongWon
Author_Institution :
Networked Media Lab., Gwangju Inst. of Sci. & Technol.
Abstract :
Understanding the maximum end-to-end throughput available with any given wireless multi-hop network is an important, but very challenging task. It may be approximated up to certain degree for several simplified topologies such as chain, cross, and others. Typically, in case of chain-topology wireless multi-hop networks employing IEEE 802.11 DCF (distributed coordination function), the maximum throughput can be derived by calculating 1-hop average throughput considering the so-called bottleneck region. However, this approximation method that utilizes only the 1-hop average throughput is limited in terms of accuracy. Thus, in this paper, after verifying the limitation of 1-hop average approximation for the throughput calculation of chain-topology multi-hop wireless networks, a refined calculation scheme is proposed by additionally considering the deviation of throughput. Especially, we focus on the fact that the throughput deviation could lead to collisions, and the throughput deviation happens due to the summation of uniformly distributed backoff times of IEEE 802.11 DCF. With several ns-2-based network simulations, we verify the impact of selected temporal variations to the throughput calculation and thus validate the improved accuracy of proposed calculation scheme.
Keywords :
IEEE standards; access protocols; wireless LAN; wireless sensor networks; IEEE 802.11; chain-topology wireless multi-hop networks; distributed coordination function; maximum end-to-end throughput; network simulations; temporal variations; throughput calculation; Communications Society; Interference; Laboratories; Network topology; Portals; Spread spectrum communication; Throughput; Wireless mesh networks; Wireless networks; Wireless sensor networks;
Conference_Titel :
Wireless Communications and Networking Conference, 2007.WCNC 2007. IEEE
Conference_Location :
Kowloon
Print_ISBN :
1-4244-0658-7
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2007.781