Title :
An Analysis of Gradual Patch Application: A Better Explanation of Patch Acceptance
Author :
Phannachitta, Passakorn ; Jirapiwong, P. ; Ihara, Akinori ; Ohira, Masao ; Matsumoto, Ken-ichi
Author_Institution :
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
Abstract :
Patch submission has been known as one of the most important activities to sustain the open source software (OSS). The patch archive can be analyzed to procure many benefit cognizance for supporting the OSS project works. The recent models and methods that analyze the patches acceptance are quite rack of comprehensive; hence, complex activities such as a committer portioning the Passed QA patch out and accept are still excluded from the analysis. Therefore, the results derived from those methods would be inadequate to conclude the actual patch acceptance. In this research, we introduce an algorithm for analyzing patch acceptance including the partial and gradually accepted conditions. Validating our algorithm, we present our methods for indicating the partial and gradual application of the Passed QA patch between either mailing list and SVN or Bugzilla and CVS which are the commonly deployed patch-activities related system. We studied on two well known OSS projects; Apache HTTP and Eclipse Platform. We obtained a fascinating conclusion that larger patches have more confident to be accepted than the smaller contradicted to other analysis that came from the recent methods.
Keywords :
public domain software; software engineering; Apache HTTP project; Eclipse Platform project; gradual patch application; open source software; passed QA patch; patch acceptance; patch submission; Communities; Context; Electronic mail; Indexes; Open source software; Mining Software Repository; Open Source Software; Partial Patch Acceptance; Patch Acceptance; Patch Submission; Patches;
Conference_Titel :
Software Measurement, 2011 Joint Conference of the 21st Int'l Workshop on and 6th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA)
Conference_Location :
Nara
Print_ISBN :
978-1-4577-1930-1
DOI :
10.1109/IWSM-MENSURA.2011.36