Temperature compensation in bootstrapped current reference source

Author

Lu, Jingmei ; Wang, Yi ; Xu, Nuo ; Gao, Minglun

Author_Institution

VLSI Design Inst., Hefei Univ. of Technol., China

fYear

2003

fDate

16-18 Dec. 2003

Firstpage

491

Lastpage

494

Abstract

This paper firstly analysis the principle of the bootstrapped current reference source and offers the equation of the fractional temperature coefficient of the reference current. With example of LVD (Low Voltage Detector), author then presents a method to gain an adjustable fractional temperature coefficient by utilizing two different types of resistors with appropriate value matching. Finally, LVD circuit has been simulated with Affirma Spectre simulator of Cadence. The result of simulation proves that this method can obtain a PTAT-like (PTAT: Proportional To Absolute Temperature) current without using bipolar transistors, which requires more costly BiCMOS technology LVD circuit in this paper has been implemented with TSMC 0.25 μm CMOS technology.

Keywords

BiCMOS integrated circuits; CMOS integrated circuits; detector circuits; integrated circuit modelling; low-power electronics; reference circuits; resistors; 0.25 micron; Affirma Spectre simulator; BiCMOS technology; CMOS technology; bootstrapped current reference source; low voltage detector circuit; reference current; resistors; temperature coefficient; temperature compensation; BiCMOS integrated circuits; CMOS technology; Circuit simulation; Circuit stability; Detectors; Differential equations; Low voltage; Power supplies; Resistors; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Solid-State Circuits, 2003 IEEE Conference on

Print_ISBN

0-7803-7749-4

Type

conf

DOI

10.1109/EDSSC.2003.1283579

Filename

1283579