• DocumentCode
    2773464
  • Title

    High performance radiation hardened register cell design on standard CMOS process

  • Author

    Wang, Weizhong

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Wisconsin-Milwaukee, Milwaukee, WI, USA
  • fYear
    2003
  • fDate
    16-18 Dec. 2003
  • Firstpage
    513
  • Lastpage
    515
  • Abstract
    We propose a new radiation hardened flip flop design suitable for mainstream CMOS processing flow. The simulation results show shorter data to Q delay than sense amplifier type flip flop used in Alpha 21264 microprocessor.
  • Keywords
    CMOS logic circuits; Q-factor; delay circuits; flip-flops; CMOS integrated circuits; CMOS process; Q delay; flip flop design; radiation hardened register cell design; CMOS process; Clocks; Delay; Digital systems; Error correction codes; Feedback; Flip-flops; Latches; Master-slave; Radiation hardening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
  • Print_ISBN
    0-7803-7749-4
  • Type

    conf

  • DOI
    10.1109/EDSSC.2003.1283584
  • Filename
    1283584
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2773464