Title :
Functional Testing of Wireless Sensor Node Designs
Author :
Virk, Kashif ; Madsen, Jan
Author_Institution :
Tech. Univ. of Denmark, Lyngby
Abstract :
Wireless sensor networks are networked embedded computer systems with stringent power, performance, cost and form-factor requirements along with numerous other constraints related to their pervasiveness and ubiquitousness. Therefore, only a systematic design methdology coupled with an efficient test approach can enable their conformance to design and deployment specifications. We discuss off-line, hierarchical, functional testing of complete wire- less sensor nodes containing configurable logic through a combination of FPGA-based board test and Software-Based Self-Test (SBST) techniques. The proposed functional test methodology has been applied to a COTS-based sensor node development platform and can be applied, in general, for testing all types of wireless sensor node designs.
Keywords :
automatic testing; field programmable gate arrays; logic testing; telecommunication computing; wireless sensor networks; COTS-based sensor node; FPGA-based board test; functional testing; networked embedded computer systems; software-based self-test techniques; systematic design methdology; wireless sensor node designs; Automatic testing; Built-in self-test; Computer networks; Costs; Embedded computing; Logic testing; Pervasive computing; Software testing; System testing; Wireless sensor networks;
Conference_Titel :
Innovations in Information Technology, 2007. IIT '07. 4th International Conference on
Conference_Location :
Dubai
Print_ISBN :
978-1-4244-1840-4
Electronic_ISBN :
978-1-4244-1841-1
DOI :
10.1109/IIT.2007.4430412