Transient response tests for mixed-signal Analogue Circuit Cells

The authors consider that approaches to structured digital DFT based on `scan-path´ techniques, are capable of being extended to test mixed-signal circuits, by minor enhancements that enable embedded analogue circuit cells to be tested concurrently with digital systems. (1). The introduction of special purpose `interface´ register structures at interfaces between analogue and digital circuits, to partition a mixed-signal device-under-test into distinct analogue and digital sections. The digital sections are then tested by established digital DFT techniques, with test access of the interfaces between the analogue and digital systems provided by the set of interface registers and the scan path. (2). Transient response analysis of the embedded analogue circuit elements, and test vectors and system responses propagated by the interface scan register set and digital scan-path structure