Title :
Automatic generation of mixed-signal test programs from simulation data
Author :
Diamant, P.E. ; Harrold, S.J.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester, Inst. of Sci. & Technol., UK
Abstract :
Links from digital simulators to automatic test equipment (ATE) are now an accepted, and in many cases indispensable part of the digital circuit designer´s armoury. However similar facilities for testing analogue and mixed-signal circuits are virtually unknown. This paper describes a test equipment independent method for automatically creating test programs from SPICE simulations of these circuits
Keywords :
application specific integrated circuits; integrated circuit testing; ATE; ATPG; SPICE simulations; analogue circuit testing; automatic generation of test programs; automatic test equipment; automatically creating test programs; digital simulators; mixed-signal IC testing; mixed-signal test programs; simulation data; test equipment independent method;
Conference_Titel :
Testing Mixed Signal Circuits, IEE Colloquium on
Conference_Location :
London
