• DocumentCode
    277355
  • Title

    Developments in testability standards

  • Author

    Wilkins, B.R.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • fYear
    1992
  • fDate
    33739
  • Firstpage
    42614
  • Lastpage
    42619
  • Abstract
    Following the publication of IEEE Standard 1149.1 (Feb. 1990), there has been widespread acceptance within the electronic circuit design community of this methodology as a means of producing testable digital circuits. The mixed-signal Standard, 1149.4, initially failed to find a sponsor and was put into abeyance; but a Working Group has now been formed under the Chairmanship of Professor Mani Soma of the University of Washington in Seattle. In November 1991, the work was endorsed by the Test Technology Technical Committee of the IEEE Computer Society, and the Working Group has since had two meetings (January and April 1992). This paper is intended to bring this activity to the attention of the Design and Test community in the UK, and to invite all interested parties to participate in the process of forming the new Standard. The process of testing an analogue or mixed-signal circuit can be broken down into a number of sub-problems, each of which will have its own requirements and limitations, and all of which have to be solved before a complete testability structure can be defined. A similar group of problems has previously been faced with digital circuits
  • Keywords
    application specific integrated circuits; integrated circuit testing; standards; IEEE standard 1149.4; design for testability; mixed-signal Standard; testability standards; testability structure; testable analogue circuits; testable mixed-signal circuits;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Testing Mixed Signal Circuits, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    168387