DocumentCode
277356
Title
IEE Colloquium on `Testing Mixed Signal Circuits´ (Digest No.118)
fYear
1992
fDate
33739
Abstract
The following topics were dealt with: mixed-signal circuit testing; analogue circuit testing; current sensing testing; transient response test; ADC testing; testability standards and IC testing
Keywords
application specific integrated circuits; integrated circuit testing; ADC testing; IC testing; analogue circuit testing; conference; current sensing testing; mixed-signal circuit testing; testability standards; transient response test;
fLanguage
English
Publisher
iet
Conference_Titel
Testing Mixed Signal Circuits, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
168388
Link To Document