Title :
IEE Colloquium on `Testing Mixed Signal Circuits´ (Digest No.118)
Abstract :
The following topics were dealt with: mixed-signal circuit testing; analogue circuit testing; current sensing testing; transient response test; ADC testing; testability standards and IC testing
Keywords :
application specific integrated circuits; integrated circuit testing; ADC testing; IC testing; analogue circuit testing; conference; current sensing testing; mixed-signal circuit testing; testability standards; transient response test;
Conference_Titel :
Testing Mixed Signal Circuits, IEE Colloquium on
Conference_Location :
London
