Measurement and simulation of near field emissions from microstrip lines

Author

Thomas, D.W.P. ; Biwojno, K. ; Xin, Tong ; Nothofer, A. ; Sewell, P. ; Christopoulos, C.

Author_Institution

George Green Inst. for Electromagn. Res., Univ. of Nottingham, Nottingham

fYear

2008

fDate

8-12 Sept. 2008

Firstpage

1

Lastpage

6

Abstract

This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.

Keywords

UHF measurement; dielectric losses; electromagnetic compatibility; microstrip lines; FR4 dielectric substrate; dielectric loss; electromagnetic compatibility; microstrip lines; near field emission measurement; probe calibration; Calibration; Circuit testing; Dielectric losses; Dielectric substrates; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Magnetic field measurement; Microstrip; Probes; electromagnetic emissions; emc; microstrip; near field scanning;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on

Conference_Location

Hamburg

Print_ISBN

978-1-4244-2737-6

Electronic_ISBN

978-1-4244-2737-6

Type

conf

DOI

10.1109/EMCEUROPE.2008.4786831

Filename

4786831