• DocumentCode
    2773594
  • Title

    Use of reverberation chamber to simulate the power delay profile of a wireless environment

  • Author

    Genender, E. ; Holloway, C.L. ; Remley, K.A. ; Ladbury, J. ; Koepke, G. ; Garbe, H.

  • Author_Institution
    Inst. fuer Grundlagen der Elektrotechnik und Messtechnik, Leibniz Univ. of Hannover, Hannover
  • fYear
    2008
  • fDate
    8-12 Sept. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of a wireless channel. For example, multipath can impact bit error rate (BER) differently from Gaussian noise. For testing wireless devices/systems in these multipath environments it is imperative to have a reliable, controllable, and statistically repeatable measurement facility. The purpose of this paper is to illustrate how the reverberation chamber can be used to simulate different multipath propagation environments. Channel characteristics such as power-delay profile, RMS-delay spread, and the Rician K-factor are examined. Results for different chamber configurations (e.g., loading of the chamber, antenna positions, etc.) are compared and their effects discussed. Results achieved inside a chamber are compared with those obtained in an actual industrial environment.
  • Keywords
    radiowave propagation; reverberation chambers; wireless channels; Gaussian noise; RMS-delay spread; Rician K-factor; bit error rate; frequency-selective fading; industrial environment; multipath propagation environment effects; power delay profile; reverberation chamber; wireless channel; wireless devices-systems testing; wireless environment; Antenna measurements; Bit error rate; Control systems; Delay; Fading; Frequency; Gaussian noise; Power system reliability; Reverberation chamber; System testing; Rician K-factor; delay spread; multipath propagation; power delay profile; reverberation chamber; wireless communications; wireless environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
  • Conference_Location
    Hamburg
  • Print_ISBN
    978-1-4244-2737-6
  • Electronic_ISBN
    978-1-4244-2737-6
  • Type

    conf

  • DOI
    10.1109/EMCEUROPE.2008.4786832
  • Filename
    4786832