DocumentCode :
2773599
Title :
Improvement of a Visualization Technique for the Passage Rate of Unit Testing and Static Checking and Its Evaluation
Author :
Muto, Yuko ; Okano, Kozo ; Kusumoto, Shinji
Author_Institution :
Grad. Sch. of Inf. Sci. & Technol., Osaka Univ., Suita, Japan
fYear :
2011
fDate :
3-4 Nov. 2011
Firstpage :
279
Lastpage :
284
Abstract :
Software visualization has attracted lots of attention. The techniques fall into two categories: visualization of software component relationships and visualization of software metrics.We have already proposed a hybrid method based on both of the two categories. The proposed method visualizes coincidence between specification and implementation from two aspects: static checking and ordinal testing by test suites. Each of the verification is performed in a method or function basis (unit testing). In the method, each ratio of the coincidence is shown by pie charts which represent classes of the target software. Whole software is represented in a weighted digraph structure.In this paper, we propose Priority Layout to emphasize important classes, and implemented our method into a tool. We have evaluated time in finding bug at source code and test cases between using Priority Layout, ISOM Layout and uncomplicated tables instead of graphs. As a result, time in finding bug at source code and test cases by proposed graph are a half of it using table.
Keywords :
directed graphs; formal verification; program debugging; program diagnostics; program testing; program visualisation; software metrics; source coding; ISOM layout; ordinal testing; passage rate; priority layout; software component relationship visualization; software metric visualization; source code; static checking; test suites; unit testing; weighted digraph structure; Computer bugs; Java; Layout; Measurement; Software; Testing; Visualization; ESC/Java2; software quality; static checking; unit testing; visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Measurement, 2011 Joint Conference of the 21st Int'l Workshop on and 6th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA)
Conference_Location :
Nara
Print_ISBN :
978-1-4577-1930-1
Type :
conf
DOI :
10.1109/IWSM-MENSURA.2011.27
Filename :
6113073
Link To Document :
بازگشت