Multipolar modelization of EMC emission tests setup for automotive vehicle

Author

Aguerre, Emmanuel ; Bunlon, Xavier ; Hélier, Marc ; Drouin, Michel

Author_Institution

Adv. Electron. Div., Technocentre Renault, Guyancourt

fYear

2008

fDate

8-12 Sept. 2008

Firstpage

1

Lastpage

6

Abstract

Electromagnetic interferences due to on board-devices may differ from what can be expected after unitary on-bench tests. This work deals with the extension to the multipolar case of a previous approach, aiming at ensuring that the on-board device performances will be satisfactory. It is based on the computation of new limits for on-bench tests obtained through a global optimization process.

Keywords

automobiles; electromagnetic compatibility; electromagnetic interference; EMC emission tests setup; automotive vehicle; electromagnetic interferences; global optimization process; multipolar modelization; on board-devices; on-bench tests; Antenna measurements; Automotive engineering; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic devices; Electromagnetic interference; Noise level; Testing; Vehicles; Voltage; N-port; Nelder-Mead simplex; Scattering parameters; Thévenin´s theorem; global optimization; multipolar;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on

Conference_Location

Hamburg

Print_ISBN

978-1-4244-2737-6

Electronic_ISBN

978-1-4244-2737-6

Type

conf

DOI

10.1109/EMCEUROPE.2008.4786834

Filename

4786834