Title :
Multipolar modelization of EMC emission tests setup for automotive vehicle
Author :
Aguerre, Emmanuel ; Bunlon, Xavier ; Hélier, Marc ; Drouin, Michel
Author_Institution :
Adv. Electron. Div., Technocentre Renault, Guyancourt
Abstract :
Electromagnetic interferences due to on board-devices may differ from what can be expected after unitary on-bench tests. This work deals with the extension to the multipolar case of a previous approach, aiming at ensuring that the on-board device performances will be satisfactory. It is based on the computation of new limits for on-bench tests obtained through a global optimization process.
Keywords :
automobiles; electromagnetic compatibility; electromagnetic interference; EMC emission tests setup; automotive vehicle; electromagnetic interferences; global optimization process; multipolar modelization; on board-devices; on-bench tests; Antenna measurements; Automotive engineering; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic devices; Electromagnetic interference; Noise level; Testing; Vehicles; Voltage; N-port; Nelder-Mead simplex; Scattering parameters; Thévenin´s theorem; global optimization; multipolar;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786834
