Title :
Identification of scattering mechanisms from measured impulse response signatures of simple conducting objects
Author :
Leeper, William ; Young, Jonathan D.
Author_Institution :
The Ohio State Univ. Electroscience Laboratory, Dept. of Electrical Engineering, Columbus, Ohio
Keywords :
Analytical models; Electric variables measurement; Frequency measurement; Laboratories; Optical diffraction; Optical polarization; Optical scattering; Physical optics; Shape measurement; Size measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1983
Conference_Location :
Houston, TX, USA
DOI :
10.1109/APS.1983.1149032
