• DocumentCode
    2773676
  • Title

    The Comparison Of Response Surface And Taguchi Methods For Multiple-response Optimization Using Simulation

  • Author

    Jones, Ken ; Johnson, Mark ; Liou, J.J.

  • Author_Institution
    Harris Semiconductor Mel~ourne, Florida 32902-0883
  • fYear
    1992
  • fDate
    28-30 Sep 1992
  • Firstpage
    15
  • Lastpage
    18
  • Keywords
    Application software; Boron; Design for manufacture; Implants; Manufacturing processes; Optimization methods; Oxidation; Response surface methodology; Robustness; Semiconductor device noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
  • Print_ISBN
    0-7803-0755-0
  • Type

    conf

  • DOI
    10.1109/IEMT.1992.639855
  • Filename
    639855