Title :
Swept frequency measurement of dielectric constant over 100 MHz to 18 GHz
Author :
McCutchan, Duane
Author_Institution :
Northorp Corp., Hawthorne, CA, USA
Abstract :
A measurement technique is in use which permits the rapid measurement of dielectric properties of material over the frequency range of 100 MHz to 18 GHz. This non-destructive measurement is readily adaptable to continuous on-line process control, dielectric thickness measurement, and low and high temperature measurements.
Keywords :
Admittance measurement; Antenna measurements; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Magnetic materials; Measurement techniques; Position measurement; Thickness measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1983
DOI :
10.1109/APS.1983.1149046
