Title :
Irregular and long time current waveform handling improvement for EMC simulation
Author :
Yuan, Shih-Yi ; Chung, Huai-En ; Chen, Chiu-Kuo ; Liao, Shry-Sann
Author_Institution :
Integrated Circuits Electromagn. Compatibility Res. Center, Feng Chia Univ., Taichung
Abstract :
Although the ICEMC measurement standards at present provides a test program guideline for system under test to simplify the EMC test, papers are suggested that different programs running on such systems do have their EMC effects. This paper proposes an efficient and flexible methodology to simulate irregular and long time instruction current waveform. This methodology is based on ICEM model and is compared to ICEMC tool set. The experiment result shows that this simulation method can handle much larger instruction current waveform simulation in comparable simulation time and simulation quality, which is important for nowadays digital world.
Keywords :
electromagnetic compatibility; integrated circuit measurement; EMC simulation; ICEM model; ICEMC measurement standards; irregular current waveform; long time current waveform; Clocks; Electromagnetic compatibility; Electromagnetic interference; Frequency estimation; Integrated circuit modeling; Integrated circuit noise; Measurement standards; Microcontrollers; SPICE; System testing; EMI simulation; ICEM; Instruction Current Model; SW EMI effect;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2008 International Symposium on
Conference_Location :
Hamburg
Print_ISBN :
978-1-4244-2737-6
Electronic_ISBN :
978-1-4244-2737-6
DOI :
10.1109/EMCEUROPE.2008.4786854