DocumentCode :
2774035
Title :
Detecting Similarity of Transferring Datasets Based on Features of Classification Rules
Author :
Abe, Hidenao ; Tsumoto, Shusaku
Author_Institution :
Sch. of Med., Shimane Univ., Izumo, Japan
fYear :
2009
fDate :
6-6 Dec. 2009
Firstpage :
412
Lastpage :
415
Abstract :
In order to transfer mined knowledge for various datasets obtained from transferring situations, it is important to detect not only availability of transferring the knowledge but also detecting their limitations of the transfer. Although most of methods to detect the limitations use performance indices of sets of classifiers such as accuracies of classifier sets, those of each classifier are also useful. Data characterizing techniques have been developed to control learning algorithm selection by using statistical measurements of a dataset. Expanding this framework, we consider a method to reuse objective rule evaluation indices of classification rules such as support, precision, and recall, to measure similarity of different datasets. In this paper, we present a method to characterize given datasets based on objective rule evaluation indices and classification learning algorithms. The experimental results show the method can detect similarity of datasets even if the datasets have totally different attribute sets. This indicates that the limitations of transferring both of classifiers and learning algorithms can be detected as the similarity among datasets by using a learning algorithm.
Keywords :
data analysis; learning (artificial intelligence); classification learning algorithms; classification rules; classifier sets; data characterizing techniques; datasets; objective rule evaluation and; similarity detection; statistical measurements; Availability; Classification algorithms; Conferences; Data mining; Databases; Information systems; Information technology; Learning systems; Machine learning algorithms; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining Workshops, 2009. ICDMW '09. IEEE International Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-5384-9
Electronic_ISBN :
978-0-7695-3902-7
Type :
conf
DOI :
10.1109/ICDMW.2009.99
Filename :
5360440
Link To Document :
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