Title :
New test access for high resolution ΣΔ ADCs by using the noise transfer function evaluation
Author :
De Venuto, Daniela
Author_Institution :
DEE Politecnico di Bari, Italy
Abstract :
A new solution to improve the testability of high resolution ΣΔ analogue to digital converters (ΣΔ ADCs) using the quantizer input as a test node is described. Both the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.
Keywords :
integrated circuit noise; integrated circuit testing; sigma-delta modulation; transfer functions; ADC test access; analogue to digital converters; audio ADC; high resolution SD ADC; noise transfer function; quantizer input test node; test response analysis computation overhead; testability; Additive noise; Delay; Delta modulation; Digital filters; Frequency; Noise figure; Noise shaping; Quantization; Testing; Transfer functions;
Conference_Titel :
Quality Electronic Design, 2004. Proceedings. 5th International Symposium on
Print_ISBN :
0-7695-2093-6
DOI :
10.1109/ISQED.2004.1283654
